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STI 5000 E
- Same Proven Technology as all 5000 Series Testers
- High Speed Single Test Measure
- Capable of Testing Multiple and Mixed Devices
- 1KV Standard, 2KV Optional
- 1NA to 50A Standard, 100A Optional
- 0.1NA Resolution
- Complete Self Test
- Auto-Calibration
- RDSON to 0.1MOHM Resolution
- Windows® Application Software
- Optional Scanner
- Optional Wafer Mapping
- Optional Curve Tracer
- MOSFET, IGBT, J-FET
Triac, SCR, Sidac, Diac, Quadrac, STS, SBS
Transistor, Diode, Opto, Zener
Regulator, MOV, Relay - Fast Data Capture
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